• DocumentCode
    1860800
  • Title

    Tra.Q — Laser marking for single wafer identification — Production experience from 100 million wafers

  • Author

    Wanka, Sven ; Rychtarik, David ; Müller, Jörg ; Geissler, Steffen ; Kappe, Philip ; Spallek, Marco ; Bauer, Uli Vom ; Ludwig, Christoph ; Wawer, Peter

  • Author_Institution
    Q-Cells SE, Bitterfeld-Wolfen, Germany
  • fYear
    2011
  • fDate
    19-24 June 2011
  • Abstract
    Single wafer identification is a mandatory element of a modern solar cell production [1]. It accelerates the efficiency roadmap of the solar cell and fosters the cost reduction roadmap of the fabrication. The laser marking concept Tra.Q creates an individual code on each and every wafer. This makes process optimization and quality control easier and faster. The solar cells are 100% traceable along the whole value chain [2-4]. Q-Cells has a broad experience of meanwhile 100 million solar cells, being fabricated in the Thalheim manufacturing line. A large statistical database is available. Typically, the code for the individual tracking is engraved onto the bare wafer before the manufacturing process. The big benefits of the single wafer identification are (a) faster learning in production, (b) steeper ramp curves for the introduction of innovations, (c) improved quality control of materials and of products from the suppliers, (d) enhanced transparency to the customer. The single wafer identification helps to make root cause analysis easier and faster and to nail down the key issues in a particular manufacturing site.
  • Keywords
    quality control; solar cells; Q-cells; Thalheim manufacturing line; cost reduction roadmap; laser marking; modern solar cell production; quality control; root cause analysis; single wafer identification-production; statistical database; Fingers; Laser theory; Manufacturing; Photovoltaic cells; Production; Quality control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-9966-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2011.6186144
  • Filename
    6186144