DocumentCode
1860800
Title
Tra.Q — Laser marking for single wafer identification — Production experience from 100 million wafers
Author
Wanka, Sven ; Rychtarik, David ; Müller, Jörg ; Geissler, Steffen ; Kappe, Philip ; Spallek, Marco ; Bauer, Uli Vom ; Ludwig, Christoph ; Wawer, Peter
Author_Institution
Q-Cells SE, Bitterfeld-Wolfen, Germany
fYear
2011
fDate
19-24 June 2011
Abstract
Single wafer identification is a mandatory element of a modern solar cell production [1]. It accelerates the efficiency roadmap of the solar cell and fosters the cost reduction roadmap of the fabrication. The laser marking concept Tra.Q creates an individual code on each and every wafer. This makes process optimization and quality control easier and faster. The solar cells are 100% traceable along the whole value chain [2-4]. Q-Cells has a broad experience of meanwhile 100 million solar cells, being fabricated in the Thalheim manufacturing line. A large statistical database is available. Typically, the code for the individual tracking is engraved onto the bare wafer before the manufacturing process. The big benefits of the single wafer identification are (a) faster learning in production, (b) steeper ramp curves for the introduction of innovations, (c) improved quality control of materials and of products from the suppliers, (d) enhanced transparency to the customer. The single wafer identification helps to make root cause analysis easier and faster and to nail down the key issues in a particular manufacturing site.
Keywords
quality control; solar cells; Q-cells; Thalheim manufacturing line; cost reduction roadmap; laser marking; modern solar cell production; quality control; root cause analysis; single wafer identification-production; statistical database; Fingers; Laser theory; Manufacturing; Photovoltaic cells; Production; Quality control;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location
Seattle, WA
ISSN
0160-8371
Print_ISBN
978-1-4244-9966-3
Type
conf
DOI
10.1109/PVSC.2011.6186144
Filename
6186144
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