Title :
Fault characterization and testability analysis of emitter coupled logic and comparison with CMOS & BiCMOS circuits
Author :
Esonu, M.O. ; Al-Khalili, D. ; Rozon, Come
Author_Institution :
Royal Military College of Canada
Keywords :
BiCMOS integrated circuits; CMOS logic circuits; Circuit faults; Circuit noise; Circuit testing; Coupling circuits; Delay; Logic testing; Performance analysis; Voltage;
Conference_Titel :
Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
Conference_Location :
IEEE
Print_ISBN :
0-7803-1281-3
