• DocumentCode
    1860876
  • Title

    Fault characterization and testability analysis of emitter coupled logic and comparison with CMOS & BiCMOS circuits

  • Author

    Esonu, M.O. ; Al-Khalili, D. ; Rozon, Come

  • Author_Institution
    Royal Military College of Canada
  • fYear
    1993
  • fDate
    3-6 May 1993
  • Firstpage
    1714
  • Lastpage
    1717
  • Keywords
    BiCMOS integrated circuits; CMOS logic circuits; Circuit faults; Circuit noise; Circuit testing; Coupling circuits; Delay; Logic testing; Performance analysis; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
  • Conference_Location
    IEEE
  • Print_ISBN
    0-7803-1281-3
  • Type

    conf

  • Filename
    692998
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1860876