DocumentCode
1860881
Title
The effect of encapsulant delamination on electrical performance of PV module
Author
Park, Nochang ; Han, Changwoon ; Hong, Wonsik ; Kim, Donghwan
Author_Institution
Phys.-of-Failure Res. Center, Korea Electron. Technol. Inst., Seongnam, South Korea
fYear
2011
fDate
19-24 June 2011
Abstract
This paper focuses on the effect of delamination on electrical performance in PV module, especially electrical loss of solar cell. Degradation mode of field aged crystalline-Si PV module has been investigated through visual microscope. Electrical performance was measured with solar simulator. Electroluminescence analysis was carried out for detecting defects of PV module. Delamination observed in the PV module has occurred at the interface between the encapsulant and the front surface of the solar cell and between the encapsulant and glass. Delamination was a main degradation mode of PV module. To describe the effect of delamination on the electrical performance, new analysis through line irradiance system for electrical mapping was used. Investigation of delamination indicated that new analysis is useful to describe the effect of delamination compared to the electroluminescence analysis.
Keywords
delamination; electroluminescence; solar cells; PV module electrical performance; Si; electrical mapping; electroluminescence analysis; encapsulant delamination effect; field aged crystalline-PV module; solar cell; visual microscope; Current measurement; Degradation; Delamination; Electroluminescence; Glass; Photovoltaic cells; Visualization;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location
Seattle, WA
ISSN
0160-8371
Print_ISBN
978-1-4244-9966-3
Type
conf
DOI
10.1109/PVSC.2011.6186147
Filename
6186147
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