• DocumentCode
    1860881
  • Title

    The effect of encapsulant delamination on electrical performance of PV module

  • Author

    Park, Nochang ; Han, Changwoon ; Hong, Wonsik ; Kim, Donghwan

  • Author_Institution
    Phys.-of-Failure Res. Center, Korea Electron. Technol. Inst., Seongnam, South Korea
  • fYear
    2011
  • fDate
    19-24 June 2011
  • Abstract
    This paper focuses on the effect of delamination on electrical performance in PV module, especially electrical loss of solar cell. Degradation mode of field aged crystalline-Si PV module has been investigated through visual microscope. Electrical performance was measured with solar simulator. Electroluminescence analysis was carried out for detecting defects of PV module. Delamination observed in the PV module has occurred at the interface between the encapsulant and the front surface of the solar cell and between the encapsulant and glass. Delamination was a main degradation mode of PV module. To describe the effect of delamination on the electrical performance, new analysis through line irradiance system for electrical mapping was used. Investigation of delamination indicated that new analysis is useful to describe the effect of delamination compared to the electroluminescence analysis.
  • Keywords
    delamination; electroluminescence; solar cells; PV module electrical performance; Si; electrical mapping; electroluminescence analysis; encapsulant delamination effect; field aged crystalline-PV module; solar cell; visual microscope; Current measurement; Degradation; Delamination; Electroluminescence; Glass; Photovoltaic cells; Visualization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-9966-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2011.6186147
  • Filename
    6186147