DocumentCode :
1861098
Title :
Low-loss contact pad with tuned impedance for operation at millimeter wave frequencies
Author :
Pfeiffer, Ullrich R.
Author_Institution :
IBM T.J. Watson Res. Center, New York, NY, USA
fYear :
2005
fDate :
10-13 May 2005
Firstpage :
61
Lastpage :
64
Abstract :
In this paper an on-chip pad structure with minimized losses and matched impedance is presented. The pads use a metal ground-shield thereunder to minimize the influence from a lossy silicon substrate. A shunt transmission line stub is used to resonate the pad capacitance, thereby providing a matched impedance into a 50 Ω on-chip transmission line. A second-tier calibration technique was used to extract their 2-port S-parameter characteristic. The measured performance is compared with simulations of standard pad structures up to 65 GHz.
Keywords :
S-parameters; electrical contacts; integrated circuit interconnections; millimetre wave integrated circuits; transmission lines; 50 ohm; 65 GHz; S-parameter; lossy silicon substrate; low-loss contact pad; matched impedance; metal ground-shield; millimeter wave frequencies; on-chip pad structure; on-chip transmission line; pad capacitance; second-tier calibration technique; shunt transmission line stub; tuned impedance; Atherosclerosis; Frequency; Germanium silicon alloys; Impedance; Millimeter wave technology; Parasitic capacitance; Shape; Silicon germanium; Substrates; Transmission lines;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Signal Propagation on Interconnects, 2005. Proceedings. 9th IEEE Workshop on
Print_ISBN :
0-7803-9054-7
Type :
conf
DOI :
10.1109/SPI.2005.1500898
Filename :
1500898
Link To Document :
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