• DocumentCode
    1861098
  • Title

    Low-loss contact pad with tuned impedance for operation at millimeter wave frequencies

  • Author

    Pfeiffer, Ullrich R.

  • Author_Institution
    IBM T.J. Watson Res. Center, New York, NY, USA
  • fYear
    2005
  • fDate
    10-13 May 2005
  • Firstpage
    61
  • Lastpage
    64
  • Abstract
    In this paper an on-chip pad structure with minimized losses and matched impedance is presented. The pads use a metal ground-shield thereunder to minimize the influence from a lossy silicon substrate. A shunt transmission line stub is used to resonate the pad capacitance, thereby providing a matched impedance into a 50 Ω on-chip transmission line. A second-tier calibration technique was used to extract their 2-port S-parameter characteristic. The measured performance is compared with simulations of standard pad structures up to 65 GHz.
  • Keywords
    S-parameters; electrical contacts; integrated circuit interconnections; millimetre wave integrated circuits; transmission lines; 50 ohm; 65 GHz; S-parameter; lossy silicon substrate; low-loss contact pad; matched impedance; metal ground-shield; millimeter wave frequencies; on-chip pad structure; on-chip transmission line; pad capacitance; second-tier calibration technique; shunt transmission line stub; tuned impedance; Atherosclerosis; Frequency; Germanium silicon alloys; Impedance; Millimeter wave technology; Parasitic capacitance; Shape; Silicon germanium; Substrates; Transmission lines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal Propagation on Interconnects, 2005. Proceedings. 9th IEEE Workshop on
  • Print_ISBN
    0-7803-9054-7
  • Type

    conf

  • DOI
    10.1109/SPI.2005.1500898
  • Filename
    1500898