• DocumentCode
    1861206
  • Title

    Image analysis of CdZnTe detectors for digital radiography

  • Author

    Giakos, G.C. ; Vedantham, S. ; Suryanarayanan, S. ; Chowdhury, S. ; Guntupalli, R. ; Odogba, J. ; Vega-Lozada, V. ; Pillai, B. ; Sheffer, D.B.

  • Author_Institution
    Dept. of Biomed. Eng., Akron Univ., OH, USA
  • Volume
    1
  • fYear
    1998
  • fDate
    18-21 May 1998
  • Firstpage
    358
  • Abstract
    In this study, the temporal response of a planar Cd1-xZnxTe sample at each frequency of a scanning square-wave test pattern, have been measured. The experimental arrangement, although is not offered for large field-of-view imaging applications, offers potential capabilities for feasibility studies, research and evaluation of the temporal response and noise characteristics of a Cd1-xZnxTe detector, for fast digital radiographic and CT applications. The dependence of the modulation transfer function (MTF(f)) of the experimental X-ray detector system of both the applied electric fields and thickness has been determined experimentally. The results of this study indicate that the overall MTF(f) of the CdZnTe detector system improves both with increasing applied bias voltage and decreasing detector thickness. Further improvement of the geometrical and signal collection parameters will improve the spatial resolution of the X-ray system significantly
  • Keywords
    II-VI semiconductors; X-ray detection; X-ray imaging; cadmium compounds; computerised tomography; radiography; zinc compounds; CT applications; CdZnTe; X-ray detector system; applied bias voltage; applied electric fields; detector thickness; digital radiography; modulation transfer function; scanning square-wave test pattern; signal collection parameters; spatial resolution; temporal response; Computed tomography; Frequency measurement; Image analysis; Radiography; Tellurium; Testing; Transfer functions; Voltage; X-ray detectors; Zinc;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1998. IMTC/98. Conference Proceedings. IEEE
  • Conference_Location
    St. Paul, MN
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-4797-8
  • Type

    conf

  • DOI
    10.1109/IMTC.1998.679805
  • Filename
    679805