• DocumentCode
    1861225
  • Title

    A deductible claim process risk model and ruin probability

  • Author

    Jie, Li ; Yongmao, Wang

  • Author_Institution
    College of Science, Yanshan University, Qinhuangdao, Hebei 066004, China
  • fYear
    2012
  • fDate
    3-5 March 2012
  • Firstpage
    42
  • Lastpage
    45
  • Abstract
    This paper studies a deductible claim process risk model. The author puts an emphasis on studying the risk model under the condition that claim number process is Poisson process and loss distribution is exponential distribution. According to the calculation, draw the interesting conclusion that under the two situations whether regard deductible as claim or not, the aggregate claim is the same. Furthermore, depending on the conclusion in classical risk models draw the expression of relative security loading, adjustment coefficient, and ruin probability. Finally, the author using renewal function and relative conclusion draw the explicit expression of ruin probability in this risk model.
  • Keywords
    Deductible; Renewal function; Risk model; Ruin probability;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Automatic Control and Artificial Intelligence (ACAI 2012), International Conference on
  • Conference_Location
    Xiamen
  • Electronic_ISBN
    978-1-84919-537-9
  • Type

    conf

  • DOI
    10.1049/cp.2012.0915
  • Filename
    6492522