Title :
Tunable replica bits for dynamic variation tolerance in 8T SRAM
Author :
Raychowdhury, Arijit ; Geuskens, Bibiche ; Bowman, Keith ; Tschanz, James ; Lu, Shih-Lien ; Karnik, Tanay ; Khellah, Muhammad ; De, Vivek
Author_Institution :
Circuits Res. Lab., Intel, Hillsboro, OR, USA
Abstract :
Infrequent dynamic events like VCC droops and temperature changes result in the use of a static VCC guard-band. Measured data on a 16KB 8T array featuring tunable replica bits illustrate the opportunity of eliminating a majority of the static guard-band in memory arrays, resulting in lower operating VCC/power.
Keywords :
SRAM chips; 8T SRAM; V<;sub>CC<;/sub> droops; dynamic variation tolerance; memory arrays; operating VCC/power; static V<;sub>CC<;/sub> guard-band; tunable replica bits; Arrays; Detectors; Measurement uncertainty; Noise; Random access memory; Timing; Tuning;
Conference_Titel :
VLSI Circuits (VLSIC), 2010 IEEE Symposium on
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-5454-9
DOI :
10.1109/VLSIC.2010.5560261
