DocumentCode :
1861267
Title :
Sputter deposited p-type nickel oxide thin films as an anode buffer layer in organic solar cells
Author :
Kim, Dong-Ho ; Kang, Jae-Wook ; Kim, Hye-Ri ; Kang, Yong-Jin ; Park, Sun-Young ; Jeong, Yong-Soo
Author_Institution :
Functional Coatings Res. Group, Korea Inst. of Mater. Sci., Changwon, South Korea
fYear :
2011
fDate :
19-24 June 2011
Abstract :
P-type NiO thin films were prepared by magnetron sputtering and their characteristic properties were investigated with varying oxygen gas ratio in sputtering ambient. From the measurements of Hall effect and Seebeck coefficient, the films were confirmed to be of p-type conduction. NiO films were applied as the anode buffer layer between ITO and active layer in organic solar cells. Effects of the buffer NiO film on the device performance were systematically studied in this work.
Keywords :
Hall effect; Seebeck effect; buffer layers; nickel compounds; semiconductor device measurement; semiconductor thin films; solar cells; sputter deposition; wide band gap semiconductors; Hall effect measurement; ITO; Seebeck coefficient measurement; active layer; anode buffer layer; device performance; magnetron sputtering; organic solar cells; p-type conduction; sputter deposited p-type nickel oxide thin films; varying oxygen gas ratio; Conductivity; Indium tin oxide; Magnetic films; Nickel; Performance evaluation; Sputtering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location :
Seattle, WA
ISSN :
0160-8371
Print_ISBN :
978-1-4244-9966-3
Type :
conf
DOI :
10.1109/PVSC.2011.6186164
Filename :
6186164
Link To Document :
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