An approach to the selection of built-in-test devices

A procedure is described by which reliability and maintainability considerations can be taken into account when ranking options for the selection of built-in test (BIT) devices. The type of constraints that are likely to influence BIT selection usually fall into one of the following categories: money, space and weight, manpower, time, and computer power and memory. Quality measures-factors which influence the overall objectives sought when employing BIT-are increasing the availability and reliability of the system and decreasing the system´s probability of a safety incident when the BIT is capable of detecting safety-critical failure modes