Title :
Optical spectroscopy of single semiconductor quantum dots
Author :
Dekel, E. ; Gershoni, D. ; Ehrenfreund, E. ; Petroff, Pierre M.
Author_Institution :
Dept. of Phys., Technion-Israel Inst. of Technol., Haifa, Israel
Abstract :
Summary form only given. Low temperature confocal optical microscopy is used to spectroscopically study emission from a single semiconductor quantum dot. The spectrally sharp transitions between discrete confined multiexcitonic states are quantitatively explained using a few interacting carrier Hamiltonian.
Keywords :
excitons; optical microscopy; photoluminescence; semiconductor quantum dots; discrete confined multiexcitonic states; few interacting carrier Hamiltonian; low temperature confocal optical microscopy; optical spectroscopy; single semiconductor quantum dots; spectrally sharp transitions; Frequency; Laser theory; Light scattering; Optical scattering; Particle scattering; Quantum dots; Rayleigh scattering; Speckle; Spectroscopy; US Department of Transportation;
Conference_Titel :
Lasers and Electro-Optics, 1999. CLEO '99. Summaries of Papers Presented at the Conference on
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-595-1
DOI :
10.1109/CLEO.1999.833863
