DocumentCode :
1861669
Title :
ZnxCd1−xS as prospective window layer in CdTe thin film solar cells from numerical analysis
Author :
Hossain, Md Sharafat ; Amin, Nowshad ; Aliyu, M.M. ; Matin, M.A. ; Siddiki, M.K. ; Razykov, T. ; Sopian, K.
Author_Institution :
Dept. of Electr., Electron. & Syst. Eng., Univ. Kebangsaan Malaysia, Bangi, Malaysia
fYear :
2011
fDate :
19-24 June 2011
Abstract :
In this work, a conventional structure of CdS/CdTe cells was investigated, where ZnxCd1-xS window material that possesses wider bandgap replaced CdS window layer. The effect of composition variation in ZnxCd1-xS was analysed for high efficiency cell using AMPS 1D Simulator and the optimal value of x was found to be around 8%. Moreover, to explore the possibility of high efficiency, ultra thin and stable ZnxCd1-xS/CdTe cells the CdTe absorber layer thickness was decreased to the extreme limit and 1μm CdTe layer showed reasonable range of efficiency with stability. The thickness of ZnxCd1-xS window layer was reduced to 80 nm to increase the overall cell performance with the insertion of ZnO/Zn2SnO4 as the buffer layer. The proposed cell with ZnxCd1-xS as window layer showed promising result with an efficiency of 22.42% (Voc = 0.98 V, Jsc = 29.35 mA/cm2, FF = 0.85) using As2Te3 as back surface field (BSF) and copper (Cu) as final back contact. The cell normalized efficiency was found to be decreased linearly at the gradient -0.24/C with the operating temperature that indicated better stability of ZnxCd1-xS/CdTe solar cells.
Keywords :
II-VI semiconductors; buffer layers; cadmium compounds; energy gap; numerical analysis; semiconductor thin films; solar absorber-convertors; solar cells; thin film devices; wide band gap semiconductors; zinc compounds; AMPS 1D simulator; As2Te3-Cu; ZnxCd1-xS-CdTe; ZnO-Zn2SnO4; absorber layer thickness; back contact; back surface field; buffer layer; cell normalized efficiency; high efficiency cell; numerical analysis; prospective window layer; size 1 mum; thin film solar cells; ultra thin cells; voltage 0.98 V; Copper; Films; Photovoltaic cells; Stability analysis; Zinc oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location :
Seattle, WA
ISSN :
0160-8371
Print_ISBN :
978-1-4244-9966-3
Type :
conf
DOI :
10.1109/PVSC.2011.6186178
Filename :
6186178
Link To Document :
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