DocumentCode :
1861772
Title :
An (ITO or AZO)/ZnO/Cu(In1−xGax)Se2 superstrate thin film solar cell structure prepared by spray pyrolysis
Author :
Babu, B.J. ; Velumani, S. ; Asomoza, R.
Author_Institution :
Dept. of Electr. Eng., CINVESTAV-IPN, Mexico City, Mexico
fYear :
2011
fDate :
19-24 June 2011
Abstract :
Feasibility of preparing a thin film (ITO or AZO)/ZnO/Cu(In1-xGax)Se2 (CIGS) heterojunction solar cell using low cost non-vacuum technique is demonstrated. Low resistive (10-4 Ohm-cm) Indium tin oxide (ITO) (>;80%T) and ZnO:Al (AZO) (10-3 Ohm-cm) (>;75%T) films of ~700 nm thickness were deposited on to glass substrates using Ultrasonic Spray Pyrolysis (USP) at 420°C and 475°C respectively. Over this a 300 nm i-ZnO buffer layer was deposited at 400°C by USP. XRD and optical data results indicates that ITO and AZO, i-ZnO crystallites exhibits cubic and hexagonal wurtizite structures with direct band gap of 3.75 and 3.32, 3.31 eV respectively. FE-SEM analysis showed pyramidal and columnar structure for ITO and AZO, i-ZnO. Composition obtained from EDAX showed the amount of tin and aluminum doped into the ITO and AZO films. Little or no interdiffusion was found at the ITO/ZnO interface, allowing the use of high temperatures for deposition. Preliminary depositions of Cu(In1-xGax)Se2 (x=1 to 0) layer over glass showed polycrystalline chalcopyrite in nature with preferred (112) orientation. Raman studies showed a peak corresponding to A1 mode CIGS phase at ~170 cm-1. A 700 nm graded CIGS layer showed high optical absorption coefficient value of 106 cm-1 with a band gap of 1.25 eV. Graded CIGS layer was deposited over ITO/ZnO and AZO/ZnO layers at a substrate temperature of 350°C after an appropriate surface treatment. XRD/FESEM analyses revealed the crystallinity and graded distribution of gallium and indium.
Keywords :
II-VI semiconductors; X-ray diffraction; aluminium; copper compounds; field emission electron microscopy; gallium compounds; indium compounds; pyrolysis; scanning electron microscopy; solar cells; spray coating techniques; ternary semiconductors; thin film devices; wide band gap semiconductors; zinc compounds; A1 mode CIGS phase; EDAX; ITO-ZnO:Al-CuIn1-xGaxSe2; USP; XRD-FESEM analysis; columnar structure; cubic wurtizite structures; electron volt energy 1.25 eV; electron volt energy 3.31 eV; electron volt energy 3.32 eV; electron volt energy 3.75 eV; hexagonal wurtizite structures; low cost nonvacuum technique; polycrystalline chalcopyrite; pyramidal structure; size 300 nm; size 700 nm; spray pyrolysis; superstrate thin film solar cell structure; temperature 350 degC; temperature 400 degC; temperature 420 degC to 475 degC; thin film heterojunction solar cell preparation; ultrasonic spray pyrolysis; Films; Gallium; Glass; Indium tin oxide; Photovoltaic cells; X-ray scattering; Zinc oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location :
Seattle, WA
ISSN :
0160-8371
Print_ISBN :
978-1-4244-9966-3
Type :
conf
DOI :
10.1109/PVSC.2011.6186181
Filename :
6186181
Link To Document :
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