• DocumentCode
    1861817
  • Title

    Defect related negative temperature coefficiency of short circuit current of Cu(In, Ga)Se2 solar cells

  • Author

    Cheng, T.-H. ; Chen, J.Y. ; Hsu, W.W. ; Liu, C.W. ; Hsiao, C.Y. ; Tseng, H.R.

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • fYear
    2011
  • fDate
    19-24 June 2011
  • Abstract
    The negative temperature coefficient of the short circuit current of Cu(In, Ga)Se2 solar cells, contrary to the positive one of Si cells, may cause more degradation of power conversion efficiency at high temperature than Si solar cells due to defects. Photoluminescence spectra show both donor-acceptor transition and band-impurity transition. At higher temperature, more unoccupied states of donors and acceptors yield relatively low luminescence intensity from the donor-acceptor-pair transition, and become efficient traps to capture photo-generated carriers. This reflects that both the short circuit current and the external quantum efficiency degrade at high temperature due to the donor and acceptor states.
  • Keywords
    copper compounds; gallium compounds; indium compounds; photoluminescence; solar cells; CuInGaSe2; acceptor states; band-impurity transition; defect related negative temperature coefficiency; donor states; donor-acceptor-pair transition; luminescence intensity; photogenerated carriers; photoluminescence spectra; power conversion efficiency; short circuit current; solar cells; Bismuth; Degradation; Photonic band gap; Photovoltaic cells; Radiative recombination; Short circuit currents; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-9966-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2011.6186184
  • Filename
    6186184