Title :
Automated transit time and transfer current extraction for single transistor geometries
Author :
Rosenbaum, T. ; Schroter, Michael ; Pawlak, Andreas ; Lehmann, Steffen
Author_Institution :
Dept. for Electron Devices & Integrated Circuits, Univ. of Technol. Dresden, Dresden, Germany
fDate :
Sept. 30 2013-Oct. 3 2013
Abstract :
The purpose of this work is to establish an automated transit time and transfer current extraction tool for HICUM/L2. The key for realizing this goal was to create an equivalent circuit that includes all relevant elements influencing the extraction by mimicking the HICUM model code. For an accurate determination of the transit time, the equivalent circuit of the intrinsic transistor is required, which is obtained by deembedding the external elements using beforehand extraction information. The realized method is demonstrated to enable automated parameter determination with high accuracy.
Keywords :
equivalent circuits; heterojunction bipolar transistors; semiconductor device models; HICUM model code; automated transfer current extraction; automated transit time extraction; equivalent circuit; heterojunction bipolar transistors; intrinsic transistor; single transistor geometry; Bismuth; Equivalent circuits; Integrated circuits; Parameter extraction; Resistance; Temperature measurement; Transistors; HICUM/L2 compact modeling; Heterojunction bipolar transistor; Parameter Extraction; Self-heating; Silicon-Germanium;
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 2013 IEEE
Conference_Location :
Bordeaux
Print_ISBN :
978-1-4799-0126-5
DOI :
10.1109/BCTM.2013.6798136
