Title :
3D frequency-dependent RLC elements extraction by full wave analysis: identification of the return current paths in complex power and ground grids of high speed VLSI circuits
Author :
Quéré, Y. ; Le Gouguec, Thierry ; Martin, P.M. ; Le Berre, D. ; Huret, F. ; David, L. ; Crégut, C.
Author_Institution :
LEST-UMR CNRS, Brest, France
Abstract :
This communication deals with the extraction and simulation of on-chip RLC per unit length (p.u.l.) elements for an efficient analysis of high speed digital circuits. In this context, the current distribution in the whole circuit, power and ground grids included, has to be known to correctly estimate inductance. By using a 3D full-wave finite elements method, we identified the current paths arising in the power and ground grids when an on-chip signal switches on a wire placed in a metal below the grids.
Keywords :
RLC circuits; VLSI; current distribution; finite element analysis; high-speed integrated circuits; inductance; network analysis; 3D frequency-dependent RLC elements extraction; 3D full-wave finite elements method; complex ground grids; complex power grids; current distribution; full wave analysis; high speed VLSI circuits; high speed digital circuits; inductance estimation; on-chip signal; return current paths; Analytical models; Circuit simulation; Context; Current distribution; Digital circuits; Finite element methods; Frequency; Inductance; RLC circuits; Very large scale integration;
Conference_Titel :
Signal Propagation on Interconnects, 2005. Proceedings. 9th IEEE Workshop on
Print_ISBN :
0-7803-9054-7
DOI :
10.1109/SPI.2005.1500929