Title :
Causality check for SI data validation
Author :
Antonini, G. ; Orlandi, A. ; Ricchiuti, V.
Author_Institution :
Dept. of Electr. Eng., L´´Aquila Univ., Italy
Abstract :
In this paper the Hilbert transform is used as tool to assess the consistency of measured or numerically computed network transfer functions with respect the causality conditions. Different implementation of the Hilbert transform are shown, discussed and applied to scattering parameters datasets characterizing passive structures on printed circuit boards.
Keywords :
Hilbert transforms; SPICE; causality; equivalent circuits; passive networks; transfer functions; Hilbert transform; SI data validation; SPICE; causality check; causality conditions; equivalent circuits; network transfer functions; passive structures; printed circuit boards; scattering parameters datasets; Circuits; Dielectric loss measurement; Digital systems; Electromagnetic compatibility; Electromagnetic propagation; Frequency domain analysis; Integral equations; Scattering parameters; Signal analysis; Time domain analysis;
Conference_Titel :
Signal Propagation on Interconnects, 2005. Proceedings. 9th IEEE Workshop on
Print_ISBN :
0-7803-9054-7
DOI :
10.1109/SPI.2005.1500932
