DocumentCode
1862062
Title
Microwave/mm-Wave imaging systems
Author
Ahmed, S. Shahnawaz
Author_Institution
Microwave Imaging Test & Meas. Div., Rohde & Schwarz GmbH & Co. KG, Munich, Germany
fYear
2013
fDate
Sept. 30 2013-Oct. 3 2013
Firstpage
49
Lastpage
52
Abstract
The interest in microwave and mm-wave imaging systems is continuously increasing. Synthetic aperture radar (SAR) used by satellite remote sensing has driven the development of microwave imaging techniques since many decades. In the meanwhile, technological advances in the manufacturing of semiconductors allow for affordable imaging solutions not only for satellites, but also for the daily use. Imaging for security applications has been in focus since some years; currently systems are also in development to address the need for non-destructive testing and evaluation (NDT&E) demands. This paper discusses the requirements behind the realization of active microwave imaging systems in order to align the modern capabilities of semiconductor manufacturing with the actual demands for efficient imaging systems.
Keywords
microwave imaging; millimetre wave imaging; nondestructive testing; remote sensing; security; sensor arrays; synthetic aperture radar; NDT&E; SAR; active microwave imaging systems; millimeter wave imaging systems; nondestructive testing and evaluation; satellite remote sensing; semiconductor manufacturing; synthetic aperture radar; Arrays; Focusing; Microwave imaging; Microwave theory and techniques; Radar imaging; Synthetic aperture radar; microwave imaging; mm-wave; monostatic; multistatic; synthetic aperture radar;
fLanguage
English
Publisher
ieee
Conference_Titel
Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 2013 IEEE
Conference_Location
Bordeaux
ISSN
1088-9299
Print_ISBN
978-1-4799-0126-5
Type
conf
DOI
10.1109/BCTM.2013.6798142
Filename
6798142
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