• DocumentCode
    1862062
  • Title

    Microwave/mm-Wave imaging systems

  • Author

    Ahmed, S. Shahnawaz

  • Author_Institution
    Microwave Imaging Test & Meas. Div., Rohde & Schwarz GmbH & Co. KG, Munich, Germany
  • fYear
    2013
  • fDate
    Sept. 30 2013-Oct. 3 2013
  • Firstpage
    49
  • Lastpage
    52
  • Abstract
    The interest in microwave and mm-wave imaging systems is continuously increasing. Synthetic aperture radar (SAR) used by satellite remote sensing has driven the development of microwave imaging techniques since many decades. In the meanwhile, technological advances in the manufacturing of semiconductors allow for affordable imaging solutions not only for satellites, but also for the daily use. Imaging for security applications has been in focus since some years; currently systems are also in development to address the need for non-destructive testing and evaluation (NDT&E) demands. This paper discusses the requirements behind the realization of active microwave imaging systems in order to align the modern capabilities of semiconductor manufacturing with the actual demands for efficient imaging systems.
  • Keywords
    microwave imaging; millimetre wave imaging; nondestructive testing; remote sensing; security; sensor arrays; synthetic aperture radar; NDT&E; SAR; active microwave imaging systems; millimeter wave imaging systems; nondestructive testing and evaluation; satellite remote sensing; semiconductor manufacturing; synthetic aperture radar; Arrays; Focusing; Microwave imaging; Microwave theory and techniques; Radar imaging; Synthetic aperture radar; microwave imaging; mm-wave; monostatic; multistatic; synthetic aperture radar;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 2013 IEEE
  • Conference_Location
    Bordeaux
  • ISSN
    1088-9299
  • Print_ISBN
    978-1-4799-0126-5
  • Type

    conf

  • DOI
    10.1109/BCTM.2013.6798142
  • Filename
    6798142