DocumentCode :
1862062
Title :
Microwave/mm-Wave imaging systems
Author :
Ahmed, S. Shahnawaz
Author_Institution :
Microwave Imaging Test & Meas. Div., Rohde & Schwarz GmbH & Co. KG, Munich, Germany
fYear :
2013
fDate :
Sept. 30 2013-Oct. 3 2013
Firstpage :
49
Lastpage :
52
Abstract :
The interest in microwave and mm-wave imaging systems is continuously increasing. Synthetic aperture radar (SAR) used by satellite remote sensing has driven the development of microwave imaging techniques since many decades. In the meanwhile, technological advances in the manufacturing of semiconductors allow for affordable imaging solutions not only for satellites, but also for the daily use. Imaging for security applications has been in focus since some years; currently systems are also in development to address the need for non-destructive testing and evaluation (NDT&E) demands. This paper discusses the requirements behind the realization of active microwave imaging systems in order to align the modern capabilities of semiconductor manufacturing with the actual demands for efficient imaging systems.
Keywords :
microwave imaging; millimetre wave imaging; nondestructive testing; remote sensing; security; sensor arrays; synthetic aperture radar; NDT&E; SAR; active microwave imaging systems; millimeter wave imaging systems; nondestructive testing and evaluation; satellite remote sensing; semiconductor manufacturing; synthetic aperture radar; Arrays; Focusing; Microwave imaging; Microwave theory and techniques; Radar imaging; Synthetic aperture radar; microwave imaging; mm-wave; monostatic; multistatic; synthetic aperture radar;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 2013 IEEE
Conference_Location :
Bordeaux
ISSN :
1088-9299
Print_ISBN :
978-1-4799-0126-5
Type :
conf
DOI :
10.1109/BCTM.2013.6798142
Filename :
6798142
Link To Document :
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