Direct measurement of optical phase in the near-field

Author

Phillips, P.L. ; Knight, Jonathan C. ; Russell, Philip St.J ; Kakarantzas, G. ; Pottage, J.M.

Author_Institution

Optoelectron. Group, Bath Univ., UK

fYear

1999

fDate

28-28 May 1999

Firstpage

69

Lastpage

70

Abstract

Summary form only given. Traditionally, the most common measurement in optics is of electromagnetic field intensity. However, to fully characterise guided wave optical devices, one requires knowledge of the spatial variation of both the phase and amplitude within the device. In this work, we measure the intensity and relative phase in the near-field of guided modes in an overmoded optical fiber. For example, the LP/sub 11/ mode consists of two primary lobes of equal intensity but are /spl pi/ out of phase. We have utilised a Mach-Zender interferometer and the technique of near-field optical microscopy to measure this phase difference.

Keywords

Mach-Zehnder interferometers; intensity measurement; near-field scanning optical microscopy; optical fibre testing; phase measurement; LP/sub 11/ mode; Mach-Zender interferometer; amplitude; direct measurement; electromagnetic field intensity; guided modes; guided wave optical devices; near-field; near-field optical microscopy; optical phase; overmoded optical fiber; phase difference; primary lobes; Apertures; Milling; Optical devices; Optical fibers; Optical filters; Optical microscopy; Optical resonators; Optical waveguides; Phase measurement; Stimulated emission;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics, 1999. CLEO '99. Summaries of Papers Presented at the Conference on

Conference_Location

Baltimore, MD, USA

Print_ISBN

1-55752-595-1

Type

conf

DOI

10.1109/CLEO.1999.833892

Filename

833892