DocumentCode :
1862362
Title :
Device parameters of Cu2ZnSnS4 thin film solar cell
Author :
Prabhakar, Tejas ; Nagaraju, J.
Author_Institution :
Dept. of Instrum. & Appl. Phys., Indian Inst. of Sci., Bangalore, India
fYear :
2011
fDate :
19-24 June 2011
Abstract :
Measurement of solar cell AC parameters (cell capacitance and resistance) is important for the design of fast, reliable and efficient power conditioners. Capacitance measurements and time domain measurements are required to completely characterize solar cells. In the present study, a Cu2ZnSnS4/ZnS heterojunction solar cell with device efficiency of 1.16% was fabricated. The ideality factor, open circuit voltage, short circuit current, fill factor and reverse saturation current were extracted from the device characteristic curves. The ac parameters were measured using time domain technique. The capacitance of the cell was calculated from the open circuit voltage decay (OCVD). The device exhibited high parallel resistance and low parallel capacitance. The carrier concentration and built in voltage were derived from the 1/CP2 versus bias voltage curve.
Keywords :
II-VI semiconductors; IV-VI semiconductors; copper compounds; semiconductor thin films; short-circuit currents; solar cells; tin compounds; zinc compounds; Cu2ZnSnS4; OCVD; bias voltage curve; capacitance measurements; carrier concentration; cell capacitance; cell resistance; device characteristic curves; device parameters; efficiency 1.16 percent; fill factor; heterojunction solar cell; high parallel resistance; ideality factor; low parallel capacitance; open circuit voltage decay; power conditioners; reverse saturation current; short circuit current; solar cell AC parameter measurement; thin film solar cell; time domain measurements; Capacitance; Current measurement; Photovoltaic cells; Resistance; Semiconductor device measurement; Temperature measurement; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location :
Seattle, WA
ISSN :
0160-8371
Print_ISBN :
978-1-4244-9966-3
Type :
conf
DOI :
10.1109/PVSC.2011.6186207
Filename :
6186207
Link To Document :
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