Reflectance spectra modeling methods

Author

Vrhel, Michael J. ; Trussell, H.J.

Author_Institution

Artifex Software Inc., San Rafael, CA

fYear

2008

fDate

12-15 Oct. 2008

Firstpage

489

Lastpage

492

Abstract

In the design of a multiband imaging device, it is useful to model the response and performance of the instrument mathematically. Determining the device performance requires providing typical input to the device. Currently, there exist databases of hyperspectral images and spectral reflectance measurements that can provide limited input. In this document, methods for generating and modeling reflectance spectra are introduced. These artificial spectra can be useful as additional input to assess the performance of hyperspectal image processing algorithms and devices under specified statistical conditions.

Keywords

image colour analysis; reflectivity; statistical analysis; hyperspectal image processing algorithms; image color analysis; multiband imaging device design; reflectance spectra modeling methods; spectral reflectance measurement; statistical condition; Artificial neural networks; Computational modeling; Distributed databases; Gaussian distribution; Hyperspectral imaging; Image color analysis; Image databases; Mathematical model; Principal component analysis; Reflectivity; Color; Color measurement; Image color analysis; Image generation; Image processing;

fLanguage

English

Publisher

ieee

Conference_Titel

Image Processing, 2008. ICIP 2008. 15th IEEE International Conference on

Conference_Location

San Diego, CA

ISSN

1522-4880

Print_ISBN

978-1-4244-1765-0

Electronic_ISBN

1522-4880

Type

conf

DOI

10.1109/ICIP.2008.4711798

Filename

4711798