Title :
Reflectance spectra modeling methods
Author :
Vrhel, Michael J. ; Trussell, H.J.
Author_Institution :
Artifex Software Inc., San Rafael, CA
Abstract :
In the design of a multiband imaging device, it is useful to model the response and performance of the instrument mathematically. Determining the device performance requires providing typical input to the device. Currently, there exist databases of hyperspectral images and spectral reflectance measurements that can provide limited input. In this document, methods for generating and modeling reflectance spectra are introduced. These artificial spectra can be useful as additional input to assess the performance of hyperspectal image processing algorithms and devices under specified statistical conditions.
Keywords :
image colour analysis; reflectivity; statistical analysis; hyperspectal image processing algorithms; image color analysis; multiband imaging device design; reflectance spectra modeling methods; spectral reflectance measurement; statistical condition; Artificial neural networks; Computational modeling; Distributed databases; Gaussian distribution; Hyperspectral imaging; Image color analysis; Image databases; Mathematical model; Principal component analysis; Reflectivity; Color; Color measurement; Image color analysis; Image generation; Image processing;
Conference_Titel :
Image Processing, 2008. ICIP 2008. 15th IEEE International Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-1765-0
Electronic_ISBN :
1522-4880
DOI :
10.1109/ICIP.2008.4711798
