Title :
A compact, transformer-based 60 GHz SPDT RF switch utilizing diode-connected SiGe HBTs
Author :
Schmid, Robert L. ; Song, Peter ; Cressler, John D.
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fDate :
Sept. 30 2013-Oct. 3 2013
Abstract :
This work describes the design of a compact 60 GHz SPDT RF switch utilizing diode-connected SiGe HBTs. At mm-wave frequencies, SiGe HBTs demonstrate better Roff/Ron ratios than CMOS and can be used to improve switch performance. A switch topology using a transformer is developed to create a SPDT with a small foot print of 190 μm × 225 μm. The transformer design is discussed and a methodology is presented to optimize the matching components of the switch. The switch is fabricated on a 180 nm SiGe BiCMOS technology platform featuring HBTs with an fT/fmax of 240/260 GHz. The switch achieves 2.7 dB insertion loss and 14 dB isolation at 60 GHz with a P1dB and IIP3 of 13.8 dBm and 23.8 dBm, respectively. This represents a 20% improvement in insertion loss in comparison to a similar 90 nm CMOS switch at 50 GHz. It is also shown that the proposed switch can help enable built-in-self-test (BIST) functionality for transmit-receive modules.
Keywords :
Ge-Si alloys; built-in self test; heterojunction bipolar transistors; semiconductor switches; BIST; SPDT RF switch; SiGe; built in self test; diode connected HBT; frequency 240 GHz; frequency 260 GHz; frequency 50 GHz; frequency 60 GHz; insertion loss; loss 2.7 dB; mm-wave frequencies; size 180 nm; switch topology; transmit receive modules; CMOS integrated circuits; Heterojunction bipolar transistors; Insertion loss; Loss measurement; Silicon germanium; Switches; Switching circuits; 60 GHz; BIST; SPDT; SiGe HBT; built-in-self-test; millimeter-wave; silicon-germanium; switch;
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 2013 IEEE
Conference_Location :
Bordeaux
Print_ISBN :
978-1-4799-0126-5
DOI :
10.1109/BCTM.2013.6798156