Title :
A 14b 200MS/s DAC with SFDR>78dBc, IM3<−83dBc and NSD<−163dBm/Hz across the whole Nyquist band enabled by dynamic-mismatch mapping
Author :
Tang, Yongjian ; Briaire, J. ; Doris, Kostas ; Van Veldhoven, Robert ; Van Beek, Pieter ; Hegt, Hans ; Van Roermund, Arthur
Author_Institution :
Eindhoven Univ. of Technol., Eindhoven, Netherlands
Abstract :
A 14-bit 200MS/s current-steering DAC with a novel digital calibration technique called dynamic-mismatch mapping (DMM) is presented. Compared to traditional static-mismatch mapping and dynamic element matching, DMM reduces the nonlinearities caused by both amplitude and timing errors, without noise penalty. This 0.14μm CMOS DAC achieves a state-of-the-art performance of SFDR>78dBc, IM3<;-83dBc and NSD<;-163dBm/Hz across the whole Nyquist band.
Keywords :
CMOS integrated circuits; calibration; digital-analogue conversion; CMOS DAC; Nyquist band; amplitude errors; current-steering DAC; digital calibration; digital-analog conversion; dynamic element matching; dynamic-mismatch mapping; size 0.14 mum; static-mismatch mapping; storage capacity 14 bit; timing errors; CMOS integrated circuits; Calibration; Current measurement; Frequency modulation; Noise; Switches; Timing; DAC; calibration; mismatch; timing error;
Conference_Titel :
VLSI Circuits (VLSIC), 2010 IEEE Symposium on
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-5454-9
DOI :
10.1109/VLSIC.2010.5560316
