DocumentCode
1862467
Title
On-line Monitoring of the MOSFET Device Junction Temperature by Computation of the Threshold Voltage
Author
Chen, Huanting ; Pickert, Volker ; Atkinson, David J. ; Pritchard, L.S.
Author_Institution
University of Newcastle upon Tyne, NEl 7RU, UK, Fax: +44(0)191 2228180
fYear
2006
fDate
4-6 April 2006
Firstpage
440
Lastpage
444
Abstract
A method for an on-line junction temperature measurement is introduced. The circuit allows the calibration of a real-time thermal model of a power MOSFET. A regular calibration of the real-time model provides an accurate thermal flux model over the lifetime of the power MOSFET. The measurement of threshold voltage is used to determine the device temperature. The paper presents the on-line measurement method, the circuit and test results.
Keywords
junction temperature; power MOSFET; threshold voltage;
fLanguage
English
Publisher
iet
Conference_Titel
Power Electronics, Machines and Drives, 2006. The 3rd IET International Conference on
Conference_Location
The Contarf Castle, Dublin, Ireland
Print_ISBN
0-86341-609-8
Type
conf
Filename
4123561
Link To Document