• DocumentCode
    1862588
  • Title

    GaN for automotive applications

  • Author

    Nishikawa, Kiisa

  • Author_Institution
    Toyota Central R&D Labs., Nagakute, Japan
  • fYear
    2013
  • fDate
    Sept. 30 2013-Oct. 3 2013
  • Firstpage
    143
  • Lastpage
    150
  • Abstract
    Many power switching devices are used in a hybrid vehicle (HV) and an electric vehicle (EV) systems. For future development of the HV/EV, higher performances than that of Si power devices, for example, low on-resistance, high speed, high operation temperature, are strongly required. GaN power devices are promising candidate for the requirements. Power modules used in HV/EV system and present status of the GaN power device development are presented. Reliability of the GaN power device was also discussed.
  • Keywords
    III-V semiconductors; elemental semiconductors; gallium compounds; hybrid electric vehicles; power semiconductor devices; semiconductor device reliability; silicon; wide band gap semiconductors; GaN; Si; automotive; electric vehicle; hybrid vehicle; power device reliability; power devices; power modules; power switching devices; Aluminum gallium nitride; Gallium nitride; HEMTs; Logic gates; Multichip modules; Silicon; Substrates; AlGaN/GaN; EV; HV; current collapse; gate insulator; lateral device; power device; vertical device;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 2013 IEEE
  • Conference_Location
    Bordeaux
  • ISSN
    1088-9299
  • Print_ISBN
    978-1-4799-0126-5
  • Type

    conf

  • DOI
    10.1109/BCTM.2013.6798163
  • Filename
    6798163