Title :
Effect of defect-rich epitaxy on crystalline silicon / amorphous silicon heterojunction solar cells and the use of low-mobility layers to improve peformance
Author :
Deceglie, Michael G. ; Atwater, Harry A.
Author_Institution :
Thomas J. Watson Labs. of Appl. Phys., California Inst. of Technol., Pasadena, CA, USA
Abstract :
We present two-dimensional device physics simulations of amorphous silicon / crystalline silicon heterojunction solar cells to explain the effects of full and localized epitaxial layers, sometimes observed in the early stages of amorphous Si deposition, on cell performance. Minimizing the defect density, thickness, and wafer area fraction covered by the epitaxial region are shown to be important factors for maximizing cell open circuit voltage. We find that localized defect-rich epitaxial patches covering small percentages of the wafer surface (~5%) can cause significant reduction in open circuit voltage, which is explained by considering lateral carrier flow in the device. We also show that a thin layer of low-mobility material, such as microcrystalline silicon, included between the wafer and amorphous regions can impede lateral carrier flow and improve conversion efficiencies in cases where isolated defective pinholes limit device performance.
Keywords :
amorphous semiconductors; carrier mobility; semiconductor epitaxial layers; semiconductor heterojunctions; silicon; solar cells; Si; amorphous region; amorphous silicon deposition; amorphous silicon-crystalline silicon heterojunction solar cells; cell open circuit voltage; cell performance; defect density minimization; device carrier flow; device performance; epitaxial region; full epitaxial layer effect; isolated defective pinholes; localized defect-rich epitaxial patches; localized epitaxial layers effect; low-mobility material thin layer; thickness minimization; two-dimensional device physics simulation; wafer area fraction minimization; wafer region; wafer surface; Epitaxial growth; Epitaxial layers; Heterojunctions; Photovoltaic cells; Semiconductor device modeling; Semiconductor process modeling; Silicon;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4244-9966-3
DOI :
10.1109/PVSC.2011.6186222