• DocumentCode
    1862764
  • Title

    Extraction of recombination parameters of amorphous silicon/crystalline silicon solar cell from lifetime spectroscopy

  • Author

    Ghosh, Kunal ; Ghosh ; Song, Nam-Kyu ; Oh, Min-Seok ; Kim, Dong-Seop ; Bowden, Stuart

  • fYear
    2011
  • fDate
    19-24 June 2011
  • Abstract
    A technique to measure the recombination parameter of a-Si/c-Si heterojunction solar cell is described in the work. In this methodology, the experimentally measured inverse lifetime by Sinton lifetime tester is fitted with A+BΔn+CΔn2 to determine the recombination parameters. The coefficients B and C are radiative and auger recombination coefficient while coefficient A depends on bulk lifetime and surface recombination velocity. The radiative and auger recombination coefficients determined from the work agrees well with previously published results while the surface recombination velocity extracted from coefficient A is typical of well passivated c-Si surface in a-Si/c-Si heterojunction solar cell.
  • Keywords
    Auger effect; electron-hole recombination; passivation; solar cells; Auger recombination; Si-Si; Sinton lifetime tester; amorphous silicon/crystalline silicon solar cell; bulk lifetime; heterojunction solar cell; inverse lifetime; lifetime spectroscopy; radiative recombination; recombination parameter extraction; surface recombination; Buffer layers; Heterojunctions; Photovoltaic cells; Radiative recombination; Silicon; Surface fitting;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-9966-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2011.6186225
  • Filename
    6186225