DocumentCode :
1862764
Title :
Extraction of recombination parameters of amorphous silicon/crystalline silicon solar cell from lifetime spectroscopy
Author :
Ghosh, Kunal ; Ghosh ; Song, Nam-Kyu ; Oh, Min-Seok ; Kim, Dong-Seop ; Bowden, Stuart
fYear :
2011
fDate :
19-24 June 2011
Abstract :
A technique to measure the recombination parameter of a-Si/c-Si heterojunction solar cell is described in the work. In this methodology, the experimentally measured inverse lifetime by Sinton lifetime tester is fitted with A+BΔn+CΔn2 to determine the recombination parameters. The coefficients B and C are radiative and auger recombination coefficient while coefficient A depends on bulk lifetime and surface recombination velocity. The radiative and auger recombination coefficients determined from the work agrees well with previously published results while the surface recombination velocity extracted from coefficient A is typical of well passivated c-Si surface in a-Si/c-Si heterojunction solar cell.
Keywords :
Auger effect; electron-hole recombination; passivation; solar cells; Auger recombination; Si-Si; Sinton lifetime tester; amorphous silicon/crystalline silicon solar cell; bulk lifetime; heterojunction solar cell; inverse lifetime; lifetime spectroscopy; radiative recombination; recombination parameter extraction; surface recombination; Buffer layers; Heterojunctions; Photovoltaic cells; Radiative recombination; Silicon; Surface fitting;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location :
Seattle, WA
ISSN :
0160-8371
Print_ISBN :
978-1-4244-9966-3
Type :
conf
DOI :
10.1109/PVSC.2011.6186225
Filename :
6186225
Link To Document :
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