Title :
Fractal Compression and Adaptive Sampling for Atomic Force Microscopy
Author :
Hung-Ming Cheng ; Chiu, George T.-C
Keywords :
Atomic force microscopy; Bandwidth; Fractals; Image coding; Image resolution; Image sampling; Optical imaging; Probes; Sampling methods; Surface cleaning;
Conference_Titel :
Advanced Intelligent Mechatronics. Proceedings, 2005 IEEE/ASME International Conference on
Print_ISBN :
0-7803-9047-4
DOI :
10.1109/AIM.2005.1500973
