DocumentCode :
1862947
Title :
Minimising the Preparation Cost of Runtime Testing Based on Testability Metrics
Author :
Gonzalez-Sanchez, Alberto ; Piel, Éric ; Gross, Hans-Gerhard ; van Gemund, Arjan J. C.
Author_Institution :
Dept. of Software Technol., Delft Univ. of Technol., Delft, Netherlands
fYear :
2010
fDate :
19-23 July 2010
Firstpage :
419
Lastpage :
424
Abstract :
Test cost minimisation approaches have traditionally been devoted to minimising "execution costs\´\´, while maximising coverage or reliability. However, in a runtime testing context, the amount of coverage or reliability that can be achieved, in other words, the system\´s Runtime Testability, is limited by the adverse effects that the interferences of runtime tests have on the system. Supporting runtime testing, therefore, introduces an additional cost in "preparatory\´\´ activities in software, (e.g., testable components) and in hardware (e.g., more memory), before certain runtime tests can be executed. In this paper we present a low-complexity, cost minimisation algorithm for the optimal selection of preparation activities, based on a near-optimal trade-off between preparation cost and a structure-based measurement of Runtime Testability, coined the Runtime Testability Metric (RTM). We perform a theoretical and empirical validation of RTM, showing that RTM is indeed a valid, and reasonably accurate measurement with ratio scale. We also present empirical data demonstrating the near-optimal performance at a low computational cost of our algorithm.
Keywords :
cost reduction; program testing; program verification; software metrics; software reliability; cost minimisation; low complexity cost minimisation algorithm; near optimal performance; near optimal trade-off; preparation cost; runtime testability; runtime testability metric; runtime testing cost; structure-based measurement; Software; online testing; runtime testability; runtime testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Software and Applications Conference (COMPSAC), 2010 IEEE 34th Annual
Conference_Location :
Seoul
ISSN :
0730-3157
Print_ISBN :
978-1-4244-7512-4
Electronic_ISBN :
0730-3157
Type :
conf
DOI :
10.1109/COMPSAC.2010.49
Filename :
5676288
Link To Document :
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