• DocumentCode
    1862947
  • Title

    Minimising the Preparation Cost of Runtime Testing Based on Testability Metrics

  • Author

    Gonzalez-Sanchez, Alberto ; Piel, Éric ; Gross, Hans-Gerhard ; van Gemund, Arjan J. C.

  • Author_Institution
    Dept. of Software Technol., Delft Univ. of Technol., Delft, Netherlands
  • fYear
    2010
  • fDate
    19-23 July 2010
  • Firstpage
    419
  • Lastpage
    424
  • Abstract
    Test cost minimisation approaches have traditionally been devoted to minimising "execution costs\´\´, while maximising coverage or reliability. However, in a runtime testing context, the amount of coverage or reliability that can be achieved, in other words, the system\´s Runtime Testability, is limited by the adverse effects that the interferences of runtime tests have on the system. Supporting runtime testing, therefore, introduces an additional cost in "preparatory\´\´ activities in software, (e.g., testable components) and in hardware (e.g., more memory), before certain runtime tests can be executed. In this paper we present a low-complexity, cost minimisation algorithm for the optimal selection of preparation activities, based on a near-optimal trade-off between preparation cost and a structure-based measurement of Runtime Testability, coined the Runtime Testability Metric (RTM). We perform a theoretical and empirical validation of RTM, showing that RTM is indeed a valid, and reasonably accurate measurement with ratio scale. We also present empirical data demonstrating the near-optimal performance at a low computational cost of our algorithm.
  • Keywords
    cost reduction; program testing; program verification; software metrics; software reliability; cost minimisation; low complexity cost minimisation algorithm; near optimal performance; near optimal trade-off; preparation cost; runtime testability; runtime testability metric; runtime testing cost; structure-based measurement; Software; online testing; runtime testability; runtime testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Software and Applications Conference (COMPSAC), 2010 IEEE 34th Annual
  • Conference_Location
    Seoul
  • ISSN
    0730-3157
  • Print_ISBN
    978-1-4244-7512-4
  • Electronic_ISBN
    0730-3157
  • Type

    conf

  • DOI
    10.1109/COMPSAC.2010.49
  • Filename
    5676288