Title :
Design and Analysis of Cost-Cognizant Test Case Prioritization Using Genetic Algorithm with Test History
Author :
Huang, Yu-Chi ; Huang, Chin-Yu ; Chang, Jun-Ru ; Chen, Tsan-Yuan
Author_Institution :
Dept. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Abstract :
During software development, regression testing is usually used to assure the quality of modified software. The techniques of test case prioritization schedule the test cases for regression testing in an order that attempts to increase the effectiveness in accordance with some performance goal. The most general goal is the rate of fault detection. It assumes all test case costs and fault severities are uniform. However, those factors usually vary. In order to produce a more satisfactory order, the cost-cognizant metric that incorporates varying test case costs and fault severities is proposed. In this paper, we propose a cost-cognizant test case prioritization technique based on the use of historical records and a genetic algorithm. We run a controlled experiment to evaluate the proposed technique´s effectiveness. Experimental results indicate that our proposed technique frequently yields a higher Average Percentage of Faults Detected per Cost (APFDc). The results also show that our proposed technique is also useful in terms of APFDc when all test case costs and fault severities are uniform.
Keywords :
genetic algorithms; program testing; regression analysis; scheduling; software fault tolerance; software metrics; software quality; APFDc; average percentage of faults detected per cost; cost-cognizant metric; cost-cognizant test case prioritization technique; fault detection; genetic algorithm; modified software quality; regression testing; software development; test case prioritization schedule technique; test history; Biological cells; Fault detection; Gallium; Measurement; Schedules; Search problems; Testing; Average Percentage of Faults Detected pre Cost(APFDc); cost-cognizant test case prioritizaion; fault severity; rate of fault detection; regression testing; test cost;
Conference_Titel :
Computer Software and Applications Conference (COMPSAC), 2010 IEEE 34th Annual
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-7512-4
Electronic_ISBN :
0730-3157
DOI :
10.1109/COMPSAC.2010.66