Title :
A large σVTH/VDD tolerant zigzag 8T SRAM with area-efficient decoupled differential sensing and fast write-back scheme
Author :
Wu, Jui-Jen ; Chen, Yen-Huei ; Chang, Meng-Fan ; Chou, Po-Wei ; Chen, Chien-Yuan ; Liao, Hung-Jen ; Chen, Ming-Bin ; Chu, Yuan-Hua ; Wu, Wen-Chin ; Yamauchi, Hiroyuki
Author_Institution :
Nat. Tsing Hua Univ., Hsinchu, Taiwan
Abstract :
This paper demonstrates for the first time quantitative performance advantages of a zigzag 8T-SRAM (Z8T) cell over the decoupled single-ended sensing 8T-SRAM (DS8T) with write-back schemes, which was previously recognized as the most area-efficient cell under large σVTH/VDD conditions. Since Z8T uses only 1T for each decoupled read-port, faster 2T differential sensing (D2S) can be implemented within the same area as the single-ended DS8T. Thanks to D2S, Z8T cell enables much faster R/W speed at VDDmin than DS8T. For the same VDDmin/speed, Z8T save the cell area by 15%. A fabricated 256-row 32Kb Z8T SRAM, using a 65nm low-power process, is 14% smaller area and 53% faster than DS8T SRAM, and is 430mV lower VDDmin than 6T-SRAM. The 32-row 4Kb Z8T macro achieves 250mV VDDmin.
Keywords :
SRAM chips; integrated circuit layout; low-power electronics; area efficient cell; area efficient decoupled differential sensing; decoupled read port; fast write back scheme; faster 2T differential sensing; low power process; size 65 nm; voltage 250 mV; zigzag 8T SRAM; CMOS process; Layout; Random access memory; Sensors; Shape; Switches; Transistors;
Conference_Titel :
VLSI Circuits (VLSIC), 2010 IEEE Symposium on
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-5454-9
DOI :
10.1109/VLSIC.2010.5560337