Title : 
Process Patterns for Web Engineering
         
        
            Author : 
Babanezhad, Reza ; Bibalan, Yusef Mehrdad ; Ramsin, Raman
         
        
            Author_Institution : 
Dept. of Comput. Eng., Sharif Univ. of Technol., Tehran, Iran
         
        
        
        
        
        
            Abstract : 
Web Engineering has been enriched with processes and modeling languages that focus on the specific features of web-based systems, taking into account the special requirements and constraints that are associated with this specific context. Process Patterns, on the other hand, represent elements of knowledge and experience in software engineering; they also act as reusable method chunks that can be used for constructing bespoke methodologies that are tailored to fit specific project situations. We propose a set of process patterns based on current web development practices. A number of prominent web development methodologies have been studied, and a set of process patterns has been elicited through abstracting their commonalities and identifying the essential activities required in a web engineering endeavor. Furthermore, a web-based systems development framework has been proposed that organizes these patterns into a generic lifecycle. The process patterns can be instantiated and assembled into a high-level development process based on the generic framework proposed.
         
        
            Keywords : 
Internet; software reusability; Web development methodologies; Web engineering; Web-based systems; bespoke methodologies; generic lifecycle; modeling languages; process patterns; reusable method; software engineering; Business; Computer architecture; Maintenance engineering; Navigation; Object oriented modeling; Programming; Software; Process Pattern; Situational Method Engineering; Software Development Methodology; Web-Based Systems Development;
         
        
        
        
            Conference_Titel : 
Computer Software and Applications Conference (COMPSAC), 2010 IEEE 34th Annual
         
        
            Conference_Location : 
Seoul
         
        
        
            Print_ISBN : 
978-1-4244-7512-4
         
        
            Electronic_ISBN : 
0730-3157
         
        
        
            DOI : 
10.1109/COMPSAC.2010.55