Title :
Localized and computationally efficient approach to shift-variant image deblurring
Author :
Subbarao, Murali ; Kang, Youn-Sik ; Dutta, Satyaki ; Tu, Xue
Author_Institution :
Dept. of Electr. & Comput. Eng., State Univ. of New York, Stony Brook, NY
Abstract :
A new localized and computationally efficient approach is presented for shift/space-variant image restoration. Unlike conventional approaches, it models shift-variant blurring in a completely local form based on the recently proposed Rao transform (RT). RT facilitates almost exact inversion of the blurring process locally and permits very fine-grain parallel implementation. The new approach naturally exploits the spatial locality of blurring kernels and smoothness of underlying focused images. It formulates the deblurring problem in terms of local parameters that are less correlated than raw image data. It is a fundamental advance that is general and not limited to any specific form of the blurring kernel such as a Gaussian. It has significant theoretical and computational advantages in comparison with conventional approaches such as those based on singular value decomposition of blurring kernel matrices. Experimental results are presented for both synthetic and real image data. This approach is also relevant to solving integral equations.
Keywords :
image restoration; integral equations; matrix algebra; singular value decomposition; Rao transform; fine-grain parallel implementation; image data; image smoothing; integral equation; kernel blurring; kernel matrix; shift-variant image deblurring; singular value decomposition; space-variant image restoration; Algorithm design and analysis; Convolution; Deconvolution; Focusing; Image analysis; Image restoration; Integral equations; Kernel; Optical microscopy; Shape; Deblurring; Deconvolution; Integral Equations; Shift/Space-Variant Image Restoration;
Conference_Titel :
Image Processing, 2008. ICIP 2008. 15th IEEE International Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-1765-0
Electronic_ISBN :
1522-4880
DOI :
10.1109/ICIP.2008.4711840