DocumentCode
1863901
Title
BIT blueprint toward more effective built-in test
Author
Daugherty, George ; Steinmetz, Mike
Author_Institution
Martin Marietta Electron. Syst., Orlando, FL, USA
fYear
1990
fDate
23-25 Jan 1990
Firstpage
353
Lastpage
360
Abstract
Information is provided concerning built-in test (BIT) and its importance to the military user. The paper is directed at the engineers who design the mission equipment. The discussion points to the need for greater availability in development of weapon systems. To most designers, availability is an unknown and unquantifiable metric that is often ignored. Availability must be defined in terms more easily understood by the design community
Keywords
automatic testing; design engineering; military computing; military equipment; reliability; weapons; BIT; availability; built-in test; design; military; mission equipment; reliability; weapon systems; Aircraft; Built-in self-test; Costs; Delay; Design engineering; Electronic equipment testing; Life testing; Logistics; Tornadoes; Weapons;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 1990. Proceedings., Annual
Conference_Location
Los Angeles, CA
Type
conf
DOI
10.1109/ARMS.1990.67983
Filename
67983
Link To Document