DocumentCode
1864026
Title
Influence of thermal fracture on scaling diode end-pumped lasers to high powers
Author
Chen, Y.F. ; Wang, C.L. ; Huang, T.M. ; Lee, L.J.
Author_Institution
Precision Instrum. Dev. Center, Nat. Sci. Council, Hsinchu, Taiwan
fYear
1999
fDate
28-28 May 1999
Firstpage
128
Lastpage
129
Abstract
Summary form only given. The authors show that the pump absorption decreases linearly with dopant concentration and, therefore, lowering the concentrations for Nd:YVO/sub 4/ crystals extends the fracture-limited pump power. They determine the optimum dopant concentration for Nd:YVO/sub 4/ crystals in scaling to higher power in a end-pumped geometry.
Keywords
fracture; light absorption; neodymium; optical pumping; solid lasers; thermal stress cracking; Nd:YVO/sub 4/ crystals; YVO/sub 4/:Nd; diode end-pumped lasers; dopant concentration; end-pumped geometry; fracture-limited pump power; high power; optimum dopant concentration; pump absorption; scaling; thermal fracture; Absorption; Crystals; Diodes; Laser theory; Plasma temperature; Power lasers; Pump lasers; Shape measurement; Slabs; Thermal conductivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 1999. CLEO '99. Summaries of Papers Presented at the Conference on
Conference_Location
Baltimore, MD, USA
Print_ISBN
1-55752-595-1
Type
conf
DOI
10.1109/CLEO.1999.833979
Filename
833979
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