Title :
Development of Concentric Micro Manipulation System
Author :
Yamamoto, Yusaku
Keywords :
Atom optics; Atomic force microscopy; Biomedical engineering; Costs; Electron optics; Fasteners; Optical microscopy; Probes; Prototypes; Scanning electron microscopy;
Conference_Titel :
Advanced Intelligent Mechatronics. Proceedings, 2005 IEEE/ASME International Conference on
Print_ISBN :
0-7803-9047-4
DOI :
10.1109/AIM.2005.1501023