Title :
Flash quantum efficiency measurements for multi-junction solar cells
Author :
Horner, G.S. ; Vasilyev, L.A. ; Schmidt, J. ; Hudson, J.E. ; Arbore, M. ; Dybiec, M. ; Good, E.A.
Author_Institution :
Tau Sci. Corp., Beaverton, OR, USA
Abstract :
Flash Quantum Efficiency- a technique used to simultaneously measure full spectrum external quantum efficiency (EQE), Reflectance (R), and Transmittance (T), has been introduced in two prior publications [1,2]. The method uses a novel architecture to simultaneously modulate a bank of solid state lightsources and measure, in real time, the cell response to each wavelength. In this work we extend it to include two additional capabilities-automated spatial mapping and multi-junction measurements. Mapping throughput of 2400 sites per hour is demonstrated on single crystal silicon cells with a signal to noise ratio that is significantly higher than conventional QE. New inverted metamorphic cells are also used to develop and demonstrate a multi-junction FlashQE technique with total acquisition time of less than four seconds per triple-junction cell.
Keywords :
elemental semiconductors; light sources; reflectivity; semiconductor device measurement; silicon; solar cells; automated spatial mapping; flash quantum efficiency measurement; full spectrum external quantum efficiency; inverted metamorphic cell response; multijunction FlashQE technique; multijunction measurement; multijunction solar cell; reflectance; single crystal silicon cell response; solid state light source; total acquisition time; transmittance; triple-junction cell; Computer architecture; Junctions; Microprocessors; Reflectivity; Silicon; Temperature measurement; Wavelength measurement;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4244-9966-3
DOI :
10.1109/PVSC.2011.6186285