Title :
Polycrystalline silicon carbide NEMS for high-temperature logic
Author :
Lee, T.-H. ; Speer, K.M. ; Fu, X.A. ; Bhunia, S. ; Mehregany, M.
Author_Institution :
Dept. of Mater. Sci. & Eng., Case Western Reserve Univ., Cleveland, OH, USA
Abstract :
We report the first ever silicon carbide (SiC) nano-electro-mechanical systems (NEMS) switches capable of operation from 25 to 600degC. We have developed both laterally- and vertically-actuated designs with threshold voltages of less than 5 V. Switches have been verified to cycle more than 3 billion times at room temperature and more than 2 million times at 600degC. Plausible models to describe the contact resistance in two actuation voltage regimes are also suggested: (i) at low actuation voltage, the resistance is dominated by the native oxide which forms on the SiC surface; and (ii) at higher actuation voltages, the resistance can be described by Sharvin´s model.
Keywords :
contact resistance; high-temperature electronics; nanoelectromechanical devices; silicon compounds; switches; NEMS switches; SiC; contact resistance; high-temperature logic; nanoelectromechanical systems; polycrystalline silicon carbide NEMS; temperature 25 degC to 600 degC; Contact resistance; Electric resistance; Electrodes; Logic; Nanoelectromechanical systems; Silicon carbide; Surface resistance; Switches; Temperature; Voltage; Contact Resistance; High Temperature; NEMS; Silicon Carbide;
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems Conference, 2009. TRANSDUCERS 2009. International
Conference_Location :
Denver, CO
Print_ISBN :
978-1-4244-4190-7
Electronic_ISBN :
978-1-4244-4193-8
DOI :
10.1109/SENSOR.2009.5285907