DocumentCode :
1865075
Title :
Epitaxial regrowth contacts for the nipi photovoltaic device
Author :
Slocum, Michael A. ; Forbes, David V. ; McNatt, J.S. ; Hubbard, Seth M.
Author_Institution :
Rochester Inst. of Technol., Rochester, NY, USA
fYear :
2011
fDate :
19-24 June 2011
Abstract :
The simulation and fabrication of a multi-period GaAs n-type I intrinsic I p-type I intrinsic (nipi) doping superlattice solar cell has been demonstrated. A fabrication procedure has been developed using regrown contacts in wet etched V-grooves. Devices have been fabricated and characterized. Current-Voltage measurements in the dark and under one sun AM0 illumination were taken both experimentally and in simulation. Devices with epitaxial regrown contacts having a shunt resistance of 3.17 kΩ, demonstrates an improvement over prior work. Simulations show the potential for high current collection, with non anti-reflection coated AM0 results achieving 24.02 mA/cm2 short circuit current, due to a drift dominated current collection mechanism.
Keywords :
III-V semiconductors; epitaxial growth; etching; gallium arsenide; semiconductor growth; semiconductor superlattices; short-circuit currents; solar cells; GaAs; current-voltage measurement; doping superlattice solar cell; drift dominated current collection mechanism; epitaxial regrowth contact; high current collection; nipi photovoltaic device; nonantireflection coated AMO result; resistance 3.17 kohm; short circuit current; shunt resistance; sun AMO illumination; wet etched V-groove; Current measurement; Epitaxial growth; Gallium arsenide; Metallization; Photovoltaic cells; Resistance; Semiconductor process modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location :
Seattle, WA
ISSN :
0160-8371
Print_ISBN :
978-1-4244-9966-3
Type :
conf
DOI :
10.1109/PVSC.2011.6186326
Filename :
6186326
Link To Document :
بازگشت