DocumentCode :
1865174
Title :
Alignment insensitive anisotropic etching of silicon cavities with smooth 49° sidewalls
Author :
Shen, C. ; Pham, H.T.M. ; Sarro, P.M.
Author_Institution :
DIMES-ECTM, Delft Univ. of Technol., Delft, Netherlands
fYear :
2009
fDate :
21-25 June 2009
Firstpage :
1071
Lastpage :
1074
Abstract :
Anisotropic etchants like TMAH are used to etch cavities with smooth sidewalls in silicon wafers for MEMS applications. However, complicated crystalline alignment steps are usually needed as crystalline misalignment will enlarge and rotate the etched cavities in an unpredictable way. In this paper, we presented a simple process to avoid unexpected cavity distortion caused by minor crystalline misalignment in TMAH etch. Besides, this process also offers smooth and less inclined sidewalls with a non-standard angle of 49deg on {100} wafers.
Keywords :
etching; micromechanical devices; silicon; MEMS applications; Si; TMAH etch; alignment insensitivity; anisotropic etching; sidewalls; silicon cavities; silicon wafers; Anisotropic magnetoresistance; Crystallization; Micromachining; Micromechanical devices; Optical distortion; Optical resonators; Optical sensors; Shape; Silicon; Sputter etching; Tetramethyl amrnonium hydroxide (TMAH); anisotropic etching; silicon bulk micromachining;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems Conference, 2009. TRANSDUCERS 2009. International
Conference_Location :
Denver, CO
Print_ISBN :
978-1-4244-4190-7
Electronic_ISBN :
978-1-4244-4193-8
Type :
conf
DOI :
10.1109/SENSOR.2009.5285944
Filename :
5285944
Link To Document :
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