• DocumentCode
    1865553
  • Title

    Fault analysis in solar PV arrays under: Low irradiance conditions and reverse connections

  • Author

    Zhao, Ye ; Lehman, Brad ; De Palma, Jean-François ; Mosesian, Jerry ; Lyons, Robert

  • Author_Institution
    Northeastern Univ., Boston, MA, USA
  • fYear
    2011
  • fDate
    19-24 June 2011
  • Abstract
    Fault analysis in solar photovoltaic (PV) arrays is a fundamental task to protect PV modules from damages and to eliminate the risks of safety hazards. This paper examines two types of unique faults found in photovoltaic (PV) array installations that have not been studied in the literature. One is a fault that occurs under low irradiance conditions. In some circumstances, fault current protection devices are unable to detect certain types of faults so that the fault may remain hidden in the PV system, even after irradiance increases. The other type of fault occurs when a string of PV modules is reversely connected, caused by inappropriate installation. This fault type brings new challenges for overcurrent protection devices because of the high rating voltage requirement. In both cases, these unique PV faults may subsequently lead to unexpected safety hazards, reduced system efficiency and reduced reliability.
  • Keywords
    electrical installation; electrical safety; fault currents; fault diagnosis; hazards; overcurrent protection; photovoltaic power systems; power generation faults; power generation protection; power generation reliability; PV array installation; PV module protection; fault analysis; fault current protection device; fault detection; high rating voltage requirement; low irradiance condition; overcurrent protection device; photovoltaic array installation; reliability reduction; reverse connection; risk elimination; safety hazard; solar PV array; solar photovoltaic array; system efficiency reduction; Circuit faults; Fault currents; Fires; Fuses; Inverters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-9966-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2011.6186346
  • Filename
    6186346