• DocumentCode
    1865567
  • Title

    An empirical mode decomposition approach for automatic diagnosis of retina digital images

  • Author

    Lahmiri, Salim ; Gargour, C.S. ; Gabrea, M.

  • Author_Institution
    Dept. of Electr. Eng., Ecole de Technol. Super., Montréal, QC, Canada
  • fYear
    2012
  • fDate
    April 29 2012-May 2 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this study six statistical textural features are extracted from retina digital images processed with the empirical mode decomposition (EMD). They are the mean, standard deviation, smoothness, third moment, uniformity, and entropy. The purpose is to classify normal and abnormal images. Five different pathologies are considered. They are artery sheath, blot hemorrhage, circinates, age-related macular drusens, and microaneurysms. Support vector machines are employed as classifier. Ten random folds are generated to perform cross-validation tests. The average and standard deviation of the correct recognition rate, sensitivity and specificity are computed for each simulation to assess the performance of the classifier. The obtained results generally outperform those given by using the discrete wavelet transform (DWT) instead of the EMD.
  • Keywords
    biomedical optical imaging; diseases; eye; feature extraction; image classification; image texture; medical image processing; support vector machines; EMD; SVM classifier; age related macular drusen pathology; artery sheath pathology; automatic retina diagnosis; blot hemorrhage pathology; circinate pathology; correct recognition rate; empirical mode decomposition approach; feature extraction; image classification; image texture entropy; image texture mean; image texture smoothness; image texture standard deviation; image texture third moment; image texture uniformity; microaneurysm pathology; random folds; retina digital images; statistical textural features; support vector machines; Digital images; Discrete wavelet transforms; Feature extraction; Retina; Support vector machines; Classification; Discrete wavelet transform; Empirical mode decomposition; Retina digital image; Support vector machines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical & Computer Engineering (CCECE), 2012 25th IEEE Canadian Conference on
  • Conference_Location
    Montreal, QC
  • ISSN
    0840-7789
  • Print_ISBN
    978-1-4673-1431-2
  • Electronic_ISBN
    0840-7789
  • Type

    conf

  • DOI
    10.1109/CCECE.2012.6334830
  • Filename
    6334830