DocumentCode :
1865567
Title :
An empirical mode decomposition approach for automatic diagnosis of retina digital images
Author :
Lahmiri, Salim ; Gargour, C.S. ; Gabrea, M.
Author_Institution :
Dept. of Electr. Eng., Ecole de Technol. Super., Montréal, QC, Canada
fYear :
2012
fDate :
April 29 2012-May 2 2012
Firstpage :
1
Lastpage :
4
Abstract :
In this study six statistical textural features are extracted from retina digital images processed with the empirical mode decomposition (EMD). They are the mean, standard deviation, smoothness, third moment, uniformity, and entropy. The purpose is to classify normal and abnormal images. Five different pathologies are considered. They are artery sheath, blot hemorrhage, circinates, age-related macular drusens, and microaneurysms. Support vector machines are employed as classifier. Ten random folds are generated to perform cross-validation tests. The average and standard deviation of the correct recognition rate, sensitivity and specificity are computed for each simulation to assess the performance of the classifier. The obtained results generally outperform those given by using the discrete wavelet transform (DWT) instead of the EMD.
Keywords :
biomedical optical imaging; diseases; eye; feature extraction; image classification; image texture; medical image processing; support vector machines; EMD; SVM classifier; age related macular drusen pathology; artery sheath pathology; automatic retina diagnosis; blot hemorrhage pathology; circinate pathology; correct recognition rate; empirical mode decomposition approach; feature extraction; image classification; image texture entropy; image texture mean; image texture smoothness; image texture standard deviation; image texture third moment; image texture uniformity; microaneurysm pathology; random folds; retina digital images; statistical textural features; support vector machines; Digital images; Discrete wavelet transforms; Feature extraction; Retina; Support vector machines; Classification; Discrete wavelet transform; Empirical mode decomposition; Retina digital image; Support vector machines;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical & Computer Engineering (CCECE), 2012 25th IEEE Canadian Conference on
Conference_Location :
Montreal, QC
ISSN :
0840-7789
Print_ISBN :
978-1-4673-1431-2
Electronic_ISBN :
0840-7789
Type :
conf
DOI :
10.1109/CCECE.2012.6334830
Filename :
6334830
Link To Document :
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