• DocumentCode
    1865750
  • Title

    Fault diagnosis of analog circuits with model-based technique

  • Author

    Catelani, M. ; Giraldi, S.

  • Author_Institution
    Dipt. di Ingegneria Elettronica, Univ. di Firenze, Italy
  • Volume
    1
  • fYear
    1998
  • fDate
    18-21 May 1998
  • Firstpage
    501
  • Abstract
    The paper presents an automatic measurement system for the fault diagnosis of electronic analog circuits. A model-based technique is implemented in order to obtain the fault diagnosis equations of the circuit under test in symbolic form with respect to the circuit elements. The main advantage of the proposed method is a reduction of the computational complexity and an increase in the computing speed with respect to other numerical techniques. In the approach, both the single fault and the double fault diagnosis are considered
  • Keywords
    analogue circuits; automatic testing; computational complexity; fault diagnosis; symbol manipulation; analog circuits; circuit elements; computational complexity; computing speed; double fault; fault diagnosis; model-based technique; single fault; symbolic form; Analog circuits; Automatic control; Circuit faults; Circuit testing; Circuit topology; Computational complexity; Equations; Fault diagnosis; Frequency; Transfer functions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1998. IMTC/98. Conference Proceedings. IEEE
  • Conference_Location
    St. Paul, MN
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-4797-8
  • Type

    conf

  • DOI
    10.1109/IMTC.1998.679838
  • Filename
    679838