Title :
Fault diagnosis of analog circuits with model-based technique
Author :
Catelani, M. ; Giraldi, S.
Author_Institution :
Dipt. di Ingegneria Elettronica, Univ. di Firenze, Italy
Abstract :
The paper presents an automatic measurement system for the fault diagnosis of electronic analog circuits. A model-based technique is implemented in order to obtain the fault diagnosis equations of the circuit under test in symbolic form with respect to the circuit elements. The main advantage of the proposed method is a reduction of the computational complexity and an increase in the computing speed with respect to other numerical techniques. In the approach, both the single fault and the double fault diagnosis are considered
Keywords :
analogue circuits; automatic testing; computational complexity; fault diagnosis; symbol manipulation; analog circuits; circuit elements; computational complexity; computing speed; double fault; fault diagnosis; model-based technique; single fault; symbolic form; Analog circuits; Automatic control; Circuit faults; Circuit testing; Circuit topology; Computational complexity; Equations; Fault diagnosis; Frequency; Transfer functions;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1998. IMTC/98. Conference Proceedings. IEEE
Conference_Location :
St. Paul, MN
Print_ISBN :
0-7803-4797-8
DOI :
10.1109/IMTC.1998.679838