DocumentCode
1866224
Title
BIT analysis: how to approach it
Author
Luthra, Puran
Author_Institution
Emerson Electr. Co., St. Louis, MO, USA
fYear
1990
fDate
23-25 Jan 1990
Firstpage
361
Lastpage
365
Abstract
A step-by-step approach to built-in test (BIT) analysis is described. A prerequisite for BIT analysis is an open dialogue between the customer and the contractor/designer. The first step in BIT analysis is having a clear understanding of BIT requirements, once these requirements are specified. When BIT requirements are being reviewed it is necessary to look at the complexity and mix of the system, i.e. the proportion of electronic, electromechanical, optical, and mechanical components and assemblies in the system
Keywords
automatic testing; design engineering; reliability; BIT; built-in test; design; reliability; requirements; Aerospace electronics; Automatic testing; Circuit faults; Condition monitoring; Contracts; Failure analysis; Flowcharts; Integrated circuit technology; Performance analysis; Roads;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 1990. Proceedings., Annual
Conference_Location
Los Angeles, CA
Type
conf
DOI
10.1109/ARMS.1990.67984
Filename
67984
Link To Document