DocumentCode :
186626
Title :
Keynote address 1: “Connecting the dots to achieve high reliability and quality”
Author :
Master, Raj N.
fYear :
2014
fDate :
1-5 June 2014
Firstpage :
1
Lastpage :
1
Abstract :
The ubiquitous trend towards a connected, digital, always-ON lifestyle is driving the development of electronic devices that have smaller form factors, higher performance requirements, along with expectations of reliability and quality. Consumers don´t buy products because of high quality but expect it. The result is a constant upward pressure on delivering high reliability at silicon, package and system level. Although this general trend holds for applications in the computing arena, gaming console arena, consumer electronics arena as well as in the portable electronics arena, the relative constraints on the cost, size and complexity of the products make this a challenging task. This is further made more difficult by unpredictable ways consumers may use the product. Microsoft evolution of hardware and reliability challenges of Surface will be described to achieve a highly reliable and quality product.
Keywords :
semiconductor device reliability; electronic devices; quality product; reliable product;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 2014 IEEE International
Conference_Location :
Waikoloa, HI
Type :
conf
DOI :
10.1109/IRPS.2014.6860568
Filename :
6860568
Link To Document :
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