Title :
Characteristics of broadband InP millimeter-wave amplifiers for radiometry
Author :
Wollack, E.J. ; Pospieszalski, M.W.
Author_Institution :
Nat. Radio Astron. Obs., Charlottesville, VA, USA
Abstract :
The performance of InP HEMT (High-Electron Mobility Transistor) amplifiers is characterized in a direct detection 3.8 mm receiver over a temperature range of 50 to 300 K. The effects of low frequency noise up-conversion are observed in the total power response. The measured spectrum of gain fluctuations at room temperature is characterized by /spl delta/g/sub n//sup 2/(f)/spl sime/(1 Hz/f)/sup /spl alpha///spl delta/g/sub 0//sup 2/, with an index /spl alpha//spl sime/0.9 and /spl delta/g/sub 0//sup 2//spl sime/6/spl times/10/sup -9/Hz/sup -1/ per device used in the amplification chain. When the devices are cooled to 50 K, /spl delta/g/sub 0//sup 2/ increases by a factor of /spl sime/5. The measured receiver sensitivity is 3 mK Hz/sup -1/2/ at an ambient temperature of 300 K and 0.8 mK Hz/sup -1/2/ at 50 K. The measured sensitivity at room temperature is the best reported for a HEMT direct detection receiver in the 3 mm atmospheric window. At 50 K the observed receiver sensitivity is competitive with the performance of sub-Kelvin bolometric detectors or SIS junctions used for direct detection.
Keywords :
HEMT circuits; III-V semiconductors; circuit noise; circuit stability; indium compounds; millimetre wave amplifiers; radiometers; radiometry; sensitivity; wideband amplifiers; 3.8 mm; 50 to 300 K; EHF; InP; InP HEMT amplifiers; MM-wave radiometry; broadband millimeter-wave amplifiers; direct detection MM-wave receiver; low frequency noise up-conversion; receiver sensitivity; total power response; Broadband amplifiers; HEMTs; High power amplifiers; Indium phosphide; Low-noise amplifiers; MODFETs; Millimeter wave measurements; Millimeter wave transistors; Temperature distribution; Temperature sensors;
Conference_Titel :
Microwave Symposium Digest, 1998 IEEE MTT-S International
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
0-7803-4471-5
DOI :
10.1109/MWSYM.1998.705080