Title :
Space compaction under generalized mergeability
Author :
Das, Sunil R. ; Petriu, Emil M. ; Barakat, Tony ; Assaf, Mansour H. ; Nayak, Amiya R.
Author_Institution :
Dept. of Electr. Eng., Ottawa Univ., Ont., Canada
Abstract :
Generalized mergeability criteria for merging an arbitrary number of output sequences have been established under conditions of stochastic dependence and independence of line errors. In this paper, we report experimental results on ISCAS 85 benchmark circuits which were targeted for space compaction using these generalized mergeability criteria
Keywords :
built-in self test; design for testability; digital simulation; logic testing; performance evaluation; stochastic systems; ISCAS 85 benchmark circuits; VLSI; generalized mergeability; line errors; output sequences; space compaction; stochastic dependence; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Compaction; Logic testing; Merging; Space technology; Stochastic processes; Very large scale integration;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1998. IMTC/98. Conference Proceedings. IEEE
Conference_Location :
St. Paul, MN
Print_ISBN :
0-7803-4797-8
DOI :
10.1109/IMTC.1998.679842
