DocumentCode :
1866982
Title :
Improved statistics for module reliability from automated measurement of cell parameters
Author :
Alers, Glenn ; Olson, Jeremy ; Green, Nathan
Author_Institution :
Phys. Dept., Univ. of California, Santa Cruz, CA, USA
fYear :
2011
fDate :
19-24 June 2011
Abstract :
An automated shading screen measurement technique is developed that can quantitatively determine shunt resistance, output current and maximum power from individual cells in a fully packaged photovoltaic module. Module performance can be tracked at the cell level to identify weak or damaged cells. A 50-100 fold increase in statistics can be obtained on degradation after field testing or accelerated lifetime testing.
Keywords :
life testing; reliability; solar cells; accelerated lifetime testing; automated measurement; automated shading screen measurement; cell level; cell parameters; field testing; fully packaged photovoltaic module; module reliability; shunt resistance; Degradation; Electrical resistance measurement; Life estimation; Photovoltaic systems; Resistance; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location :
Seattle, WA
ISSN :
0160-8371
Print_ISBN :
978-1-4244-9966-3
Type :
conf
DOI :
10.1109/PVSC.2011.6186401
Filename :
6186401
Link To Document :
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