DocumentCode
1866982
Title
Improved statistics for module reliability from automated measurement of cell parameters
Author
Alers, Glenn ; Olson, Jeremy ; Green, Nathan
Author_Institution
Phys. Dept., Univ. of California, Santa Cruz, CA, USA
fYear
2011
fDate
19-24 June 2011
Abstract
An automated shading screen measurement technique is developed that can quantitatively determine shunt resistance, output current and maximum power from individual cells in a fully packaged photovoltaic module. Module performance can be tracked at the cell level to identify weak or damaged cells. A 50-100 fold increase in statistics can be obtained on degradation after field testing or accelerated lifetime testing.
Keywords
life testing; reliability; solar cells; accelerated lifetime testing; automated measurement; automated shading screen measurement; cell level; cell parameters; field testing; fully packaged photovoltaic module; module reliability; shunt resistance; Degradation; Electrical resistance measurement; Life estimation; Photovoltaic systems; Resistance; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location
Seattle, WA
ISSN
0160-8371
Print_ISBN
978-1-4244-9966-3
Type
conf
DOI
10.1109/PVSC.2011.6186401
Filename
6186401
Link To Document