Title :
Systematic reliability characterizations on Average Output Voltage (AVO) shift of Display Driver IC by HTOL
Author :
Jungdong Kim ; Donghun Kim ; Minhyeok Choe ; Kidan Bae ; Sangchul Shin ; Sangwoo Pae ; Jongwoo Park
Author_Institution :
Syst. LSI Bus., Samsung Electron. Co., Ltd., Yongin, South Korea
Abstract :
HTOL study on Display Driver IC (DDI) using 70nm process technology node is presented in this work. DDI is an IC that controls the display color pixels. The Average Voltage Output (AVO) and Deviation Voltage Output (DVO) are the two critical parameters for reliability that determines the quality of display. We report the fails observed in early product HTOL testing due to Vt mismatch of transistors in the amplifier design after aging and fixes implemented to significantly improve product reliability.
Keywords :
driver circuits; integrated circuit reliability; AVO shift; DDI; DVO; HTOL testing; amplifier design; average output voltage shift; deviation voltage output; display color pixels; display driver IC; size 70 nm; systematic reliability characterization; Integrated circuit reliability; Integrated circuits; Qualifications; Stress; Transistors; Voltage control; AVO; HTOL; mDDI; mismatch; reliability qualification;
Conference_Titel :
Reliability Physics Symposium, 2014 IEEE International
Conference_Location :
Waikoloa, HI
DOI :
10.1109/IRPS.2014.6860618
