• DocumentCode
    1867579
  • Title

    System impact studies for PV units what to model?

  • Author

    de Arizon, P. ; Dall, C. ; Landry, M. ; Funk, J.

  • Author_Institution
    Mott MacDonald Inc., The Woodlands, TX, USA
  • fYear
    2011
  • fDate
    19-24 June 2011
  • Abstract
    Interconnection procedures for conventional generation and wind turbine generators are considered common practice with several Planning Standards across the US clearly addressing the studies to be conducted. Currently the PV market is regulated by IEEE 1547 [1] and UL1741 interconnection and safety standards for distributed generation and do not addressed the largest interconnected PV units. With the introduction of large solar units to the bulk electric grid, determining the studies to be conducted and the appropriate models to be used is a new challenge facing the electric industry. In 2010 Mott MacDonald Inc. (MMI) conducted a system impact study for a solar project with a maximum generating capacity of 32 MW. This paper discusses in detail the electric power system studies and modeling methodology adopted for the impact analysis of a large PV solar plant on the bulk electrical system.
  • Keywords
    IEEE standards; distributed power generation; photovoltaic power systems; power distribution planning; power grids; power system interconnection; IEEE 1547; Mott MacDonald Inc; PV market; Planning Standards; UL1741 interconnection; US; bulk electric grid; bulk electrical system; distributed generation; electric industry; electric power system studies; impact analysis; interconnected PV units; interconnection procedures; large PV solar plant; large solar units; modeling methodology; power 32 MW; safety standards; solar project; system impact studies; wind turbine generators; Circuit faults; Generators; Integrated circuit interconnections; Inverters; Power system dynamics; Power system stability; Reactive power;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-9966-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2011.6186425
  • Filename
    6186425