• DocumentCode
    1867634
  • Title

    Feature-based object modelling for visual surveillance

  • Author

    Baugh, Gary ; Kokaram, Anil

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Trinity Coll. Dublin, Dublin
  • fYear
    2008
  • fDate
    12-15 Oct. 2008
  • Firstpage
    1352
  • Lastpage
    1355
  • Abstract
    This paper introduces a new feature-based technique for implicitly modelling objects in visual surveillance. Previous work has generally employed background subtraction and other image or motion based object segmentation schemes for the first step in identifying objects worthy of attention. Given that background subtraction is a notoriously noisy process, this paper investigates an alternative strategy by instead employing feature (SIFT [1]) clustering to characterise objects. The segmentation step is therefore performed on the sparse feature space instead of the image data itself. The paper also presents an application employing this idea for automatic detection of illegal dumping from CCTV footage. The Viterbi algorithm then allows robust tracking [2] of objects generated from the spatial clustering of these sparse foreground feature maps.
  • Keywords
    closed circuit television; image motion analysis; image segmentation; video surveillance; CCTV footage; SIFT; Viterbi algorithm; automatic detection; background modelling; background subtraction; feature-based object modelling; feature-based technique; foreground estimation; image based object segmentation; image data; motion based object segmentation; robust object tracking; sparse feature space; sparse foreground feature maps; spatial clustering; visual surveillance; Background noise; Computer vision; Educational institutions; Image segmentation; Layout; Object detection; Object recognition; Object segmentation; Surveillance; Viterbi algorithm; SIFT; background modelling; foreground estimation; visual surveillance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing, 2008. ICIP 2008. 15th IEEE International Conference on
  • Conference_Location
    San Diego, CA
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4244-1765-0
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2008.4712014
  • Filename
    4712014